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Electronics Design Group
Results: 177

#	Item
21	Tecate Group Aluminum Electrolytic Surface Mount Capacitors SURFACE MOUNT ALUMINUM LONG LIFE LOW IMPEDANCE TYPE MXWRU Add to Reading List Source URL: www.tecategroup.com Language: English - Date: 2013-07-15 14:10:03 Capacitor Technology Electromagnetism Electronic design Electronics manufacturing Surface-mount technology
22	Tecate Group Aluminum Electrolytic Surface Mount Capacitors SURFACE MOUNT ALUMINUM LOW IMPEDANCE HIGH FREQ. 5.4MM HEIGHT TYPE MXZM FEATURES Add to Reading List Source URL: www.tecategroup.com Language: English - Date: 2013-07-18 16:44:43 Technology Capacitors Electromagnetism Electrical engineering Electronic design Electronics manufacturing Surface-mount technology
23	Tecate Group SURFACE MOUNT ALUMINUM LONG LIFE, 105°C, TYPE MXWL Add to Reading List Source URL: www.tecategroup.com Language: English - Date: 2013-07-26 16:47:06 Capacitors Electromagnetism Technology Electrical engineering Electronic design Electronics manufacturing Surface-mount technology
24	Coupled Microstrip Filters: Simple Methodologies for Improved Characteristics Kamaljeet Singh, R. Ramasubramanian, S. Pal Communication Systems Group, ISRO Satellite Center, Bangalore, India Abstract Add to Reading List Source URL: www.rfcafe.com Language: English - Date: 2015-02-08 22:09:04 Linear filters Analog circuits Electronic design Signal processing filter Electronic circuits Electronic filter Digital filter Topology Microstrip Electronic engineering Electronics Electromagnetism
25	Who Ate My Battery? Why software engineers are the key to low power system design Jeremy Bennett, Embecosm Abstract Despite a decade of innovative development, and despite improvements in battery technology, a modern sma Add to Reading List Source URL: www.embecosm.com Language: English - Date: 2013-01-16 23:54:46 Integrated circuits IEEE standards Electronics manufacturing Joint Test Action Group Debuggers PSoC Field-programmable gate array Programmer OpenRISC Electronic engineering Electronics Embedded systems
26	Datasheet High Quality, Low Cost Test Overview DFTMAX™ is a comprehensive Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-03-20 14:15:36 Electronics manufacturing Electronic design Integrated circuits Automatic test pattern generation Test compression Scan chain Boundary scan Joint Test Action Group Physical design Electronic engineering Electronics Electronic design automation
27	Progress in holographic video displays based on guided-wave acousto-optic devices Quinn Y. J. Smithwick, Daniel E. Smalley, V. Michael Bove, Jr., and James Barabas Object-Based Media Group, MIT Media Laboratory, Room E15 Add to Reading List Source URL: excedrin.media.mit.edu Language: English - Date: 2013-07-01 08:09:15 Telecommunications engineering Electronic design Single-sideband modulation Baseband Modulation Frequency modulation Radio electronics Bandwidth Sideband Electronic engineering Electronics Signal processing
28	Instrumentation and Technology Development Monash Facility for Instrumentation and Technology Development provides electronics and mechanical engineering services for the design and development of custom instrumentation Add to Reading List Source URL: www.platformtechnologies.org Language: English - Date: 2014-08-22 03:11:43 Numerical control Fabrication EDM Welding Computer-aided design Electronic engineering Technology Physics Triumph Group Machining Electrical discharge machining Engineering
29	How to overcome/avoid High Frequency Effects on Debug Interfaces – Trace Port Design Guidelines An On-Chip Debugger/Analyzer (OCD) like iSYSTEM’s iC5000 (Figure 1) acts as a link to the target hardware by standard de Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:22:02 Electronics manufacturing IEEE standards Electronic test equipment Electronic design automation Signal integrity Oscilloscope Joint Test Action Group Printed circuit board Nexus Electronics Electronic engineering Technology
30	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:46:28 Electronic engineering Joint Test Action Group Boundary scan Design for testing Boundary scan description language Electronics manufacturing Manufacturing Electronics

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